Characteristics of storage related capacity loss in Ni/H2 cells

摘要

The changes in the capacity, voltage and pressure profile of flight configuration Ni/H2 cells when they are stored for extended periods is examined. The Ni/H2 cells exhibit capacity fade phenomenon regardless of their design when they are stored at room temperature. Capacity loss also occurs if old cells (5 years old) are stored in a very low rate trickle charge (C/200 rate) condition. A periodic recharge technique leads to pressure rise in the cells. Conventional trickle charge (C/100 rate) helps in minimizing or eliminating the second plateau which is one of the characteristics of the capacity fade phenomenon.