Transient Radiation Darkening Features in VISAR Window

摘要

We have studied and characterized radiation-induced changes in the index ofrefraction of materials used in Z experiments. Interferometric measurements of the radiation-induced change in the real part, n, of the complex index of refraction, N = n + iK, have been made in lithium fluoride (LiF), sapphire, and fused silica samples. Our results indicate that the index changes are small, with (delta)n/n (approx) 1 x 10(sup -5)/kGy. In addition, we have characterized the dose dependence of the radiation-induced transient radiation darkening (TRD) of these materials, which is related to K, the imaginary part of the refractive index. We have also measured time-resolved spectral profiles of TRD in LiF and sapphire, and have examined the results in terms of known color centers and possible colloid aggregation.