首页> 美国政府科技报告 >A MEASUREMENT IN GLEEP OF THE THERMAL NEUTRON ABSORPTION CROSS-SECTION OF A SAMPLE OF HIGHLY PURIFIED SILICON
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A MEASUREMENT IN GLEEP OF THE THERMAL NEUTRON ABSORPTION CROSS-SECTION OF A SAMPLE OF HIGHLY PURIFIED SILICON

机译:一种高纯硅样品的热中子吸收截面的测量

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摘要

A measurement has been made in GLEEP of the thermal neutron absorption cross-section of a highly purified sample of natural silicon. This has given a value of 0.176 ±0.005 barns compared with the value published in BNL 325 of 0.160 ±0.020 barns.

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