Investigation of Reliability Attributes and Accelerated Stress Factors on Terrestrial Solar Cells. Sixth Quarterly Report, July 1-October 1, 1979

摘要

Results obtained during the reporting period include the identification of need for a short-interval solar cell tester and the definition of such a tester, the acquisition of significant amounts of data on stress-tested cells of two types from most of the planned stress tests, and progress in understanding the types of measurements and methods of measurement appropriate for study of second quadrant cell characteristics. Cells subjected to B-T stress testing at 75 exp 0 C showed very little P/sub m/ degradation after 1200 to 2500 stress hours. Cells stressed at higher temperatures showed greater degradation; this was especially true of cells subjected to 150 exp 0 C B-T stress. Significant P/sub m/ degradation was observed for pressure cooker T-H stressed cells. Bias was observed to be an accelerating factor for 85 exp 0 C/85% R.H. T-H stress, but not for pressure cooker T-H stress. (ERA citation 05:018577)