Reliability Considerations of Electronics Components for the Deep Underwater Muon and Neutrino Detection System

摘要

The reliability of some electronics components for the Deep Underwater Muon and Neutrino Detection (DUMAND) System is discussed. An introductory overview of engineering concepts and technique for reliability assessment is given. Component reliability is discussed in the contest of major factors causing failures, particularly with respect to physical and chemical causes, process technology and testing, and screening procedures. Failure rates are presented for discrete devices and for integrated circuits as well as for basic electronics components. Furthermore, the military reliability specifications and standards for semiconductor devices are reviewed. (ERA citation 05:027634)