Implications for Surface Science of Doppler-Shift Laser-Fluorescence Spectroscopy

摘要

This paper deals with the recent development of laser-induced fluorescence of sputtered atoms. Doppler-shift laser-induced fluorescence spectroscopy (LFS) provides a sensitive, high-resolution method for obtaining both sputtered neutral atom and ion velocity distributions and relative sputtering yields. Certain aspects of charge transfer processes at surfaces are reviewed particularly as they relate to theories of secondary ion emission. It is shown how LFS has been used to determine the number density velocity distributions of neutral Zr atoms sputtered from a Zr metal surface in the a exp 3 F sub 2 ground state and in two metastable states (a exp 3 F sub 3 sub 4 ) which lie 570 and 1241 cm exp -1 above the ground state. Sputtering was by Ar exp + and Kr exp + ions at 1.5 to 3 keV. 50 references, 11 figures, 2 tables. (ERA citation 08:021063)