Sputter-Induced Erosion of Alkali Metal Surfaces - AES, XPS and SIMS Studies

摘要

This paper will discuss the manner in which the techniques of Auger-electron spectroscopy (AES), X-ray-photoelectron spectroscopy (XPS), secondary-ion mass spectroscopy (SIMS) and ion-scattering spectroscopy (ISS) may be used to study the use of high secondary-ion-yield surfaces as a means of reducing plasma-impurity influx in magnetic-confinement fusion devices. (ERA citation 08:024759)