Development of a High Resolution Cylindrical Crystal Spectrometer for Line Shape and Spectral Diagnostics of X-Rays Emitted from - Hot - Plasmas. Final Report, June 1, 1976-December 31, 1983

摘要

The development, installation and evaluation of a high resolution X-ray spectroscopic diagnostics are reported. The approach has been to optimize spectrometer throughput to enable single shot plasma diagnostics with good time resolution and to ensure sufficient energy resolution to allow line profile analysis. These goals have been achieved using a new X-ray geometry combined with a new position sensitive X-ray detector. These diagnostics have been used at Alcator C to detect X-ray emission of highly ionized impurity elements as well as argon seed elements specially introduced into the plasma for this diagnostic. Temporally resolved ion temperature profiles have been obtained from the recorded X-ray spectra simultaneously with other plasma parameters such as electron temperature, ionization temperature and ionization stage distribution. Radial profiles have also been measured. The developed X-ray diagnostics thus serve as a major multiparameter probe of the central core of the plasma with complementary information on radial profiles. (ERA citation 09:012987)