首页> 美国政府科技报告 >WIPP (Waste Isolation Pilot Plant)/SRL in Situ Tests: Part 2, Pictorial History of MIIT (Materials Interface Interactions Tests) and Final MIIT Matrices, Assemblies, and Sample Listings
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WIPP (Waste Isolation Pilot Plant)/SRL in Situ Tests: Part 2, Pictorial History of MIIT (Materials Interface Interactions Tests) and Final MIIT Matrices, Assemblies, and Sample Listings

机译:WIpp(废物隔离试验工厂)/ sRL原位测试:第2部分,mIIT图像历史(材料界面相互作用测试)和最终mIIT矩阵,装配和样品列表

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In situ testing of Savannah River Plant (SRP) waste glass is an important component in ensuring technical and public confidence in the safety and effective performance of the wasteforms. Savannah River Laboratory (SRL) is currently involved in joint programs involving field testing of SRP waste in Sweden, Belgium, and the United Kingdom. Most recently, this in situ effort has been expanded to include the first field tests to be conducted in the United States, involving burial of a variety of simulated nuclear waste systems. This new effort, called the Materials Interface Interactions Tests or MIIT, is a program jointly conducted by Sandia National Laboratory/Waste Isolation Pilot Plant (WIPP) and SRL. Over 1800 samples, supplied by the United States, France, West Germany, Belgium, Canada, Japan, and the United Kingdom, were buried approximately 650m below the earth's surface in the salt geology at WIPP, near Carlsbad, New Mexico. The MIIT program is one of the largest cooperative efforts ever undertaken in the waste management field; the data produced from these tests are designed to benefit a wide cross-section of the waste management community. An earlier document provided an overview of the WIPP MIIT program and described its place in the waste glass assessment program at Savannah River. This document represents the second in this series and its objectives include: (1) providing a pictorial history of assembly and installation of wasteforms, metals, and geologic samples in WIPP; (2) providing 'finalized and completed' sample matrices for the entire 7-part MIIT program; (3) documenting final sample assemblies by the use of schematic drawings, including each sample, its orientation, and its environment; and (4) providing a complete listing of all samples and the means for managing analyses and resulting data. (ERA citation 12:020657)

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