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Comparison of low-energy x-ray and cobalt-60 irradiations of MOS devices as a function of gate bias.

机译：作为栅极偏压的函数的mOs器件的低能X射线和钴-60辐射的比较。

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摘要

The E(sup (minus)(1/2)) electric field dependence of the saturated density of interface traps in MOS devices is used to improve estimates of charge yield during (sup 60)Co irradiations. Previous discrepancies between 10-keV x-ray and (sup 60)Co response are resolved. 14 refs., 7 figs.

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Shaneyfelt, M. R.; Fleetwood, D. M.; Schwank, J. R.; Hughes, K. L.;
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年度 1991
页码 1-7
总页数 7
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
MOS Transistors; Physical Radiation Effects; Cobalt 60; Electric Fields; Gamma Radiation; X Radiation; Radiation effects; EDB/440200; EDB/426000;

机译：mOs晶体管;物理辐射效应;钴60;电场;γ辐射; X辐射;辐射效应; EDB / 440200; EDB / 426000;

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专利

1. Charge yield for cobalt-60 and 10-keV X-ray irradiations of MOS devices [J] . Shaneyfelt M.R., Fleetwood D.M. IEEE Transactions on Nuclear Science . 1991,第6期

机译：MOS器件的钴60和10-keV X射线辐射的电荷产量
2. Using laboratory X-ray and cobalt-60 irradiations to predict CMOS device response in strategic and space environments [J] . Fleetwood D.M., Winokur P.S. IEEE Transactions on Nuclear Science . 1988,第6期

机译：使用实验室X射线和钴60辐射来预测战略和太空环境中CMOS器件的响应
3. Synchrotron X-Ray Irradiation Effects on the Device Characteristics and the Resistance to Hot-Carrier Damage of MOSFETs with 4 nm Thick Gate Oxides [J] . YUUSUKE TANAKA, AKIRA TANABE, KATSUMI SUZUKI Journal of Electronic Materials . 1998,第7a12期

机译：同步辐射对4nm厚栅极氧化物MOSFET器件特性和抗热载流子损伤的影响
4. Study of Floating Gate MOS devices transients during switched bias irradiations [C] . Gacialnza M., Lipovetzky J., Redin E., Proceedings of the Argentine School of Micro-Nanoelectronics Technology and Applications 2010 . 2010

机译：开关偏置辐射期间浮栅MOS器件瞬态的研究
5. Inactivation of Escherichia coli O157:H7 on baby spinach using low-energy X-ray irradiation. [D] . Moosekian, Scott. 2012

机译：使用低能X射线辐射灭活菠菜上的大肠杆菌O157：H7。
6. Mass spectrometric evidence for the modification of small molecules in a cobalt-60 irradiated rodent diet [O] . Jeevan K. Prasain, Landon S. Wilson, Alireza Arabshahi, -1

机译：钴60辐照啮齿动物饮食中小分子修饰的质谱证据
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8. Evaluation of Silicon-on-Insulator MOS (Metal-Oxide-Semiconductor) Transistor Response to 10-KeV X-ray and Cobalt-60 Irradiation [R] . Fleetwood, D. M. , Tsao, S. S. , Winokur, P. S. 1988

机译：评估绝缘体上硅mOs（金属氧化物半导体）晶体管对10-KeV X射线和钴-60辐照的响应

Comparison of low-energy x-ray and cobalt-60 irradiations of MOS devices as a function of gate bias.

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