X-ray analysis of alpha mercuric iodide crystal structure and processing effects

摘要

X-ray topography and rocking curve experiments were performed on (alpha)-mercuric iodide samples. As-grown crystals were examined for Intrinsic defects and crystallinity. Orientation of certain defects depends on the direction of crystal growth. The propagation of as-grown crystalline features was documented. The extent of crystal damage Introduced during various steps of device fabrication such as sawing, polishing, etching and contact deposition was explored. Coefficients of linear thermal expansion of (alpha)(sub 33) = 54 (plus minus) 5(center dot)10(sup (minus)6)/(degrees)C along the tetragonal c-axis, (001) direction and (alpha)(sub 11) = 11 (plus minus) 4(center dot)10(sup (minus)6)/(degrees)C in the (100) direction were measured.