首页> 美国政府科技报告 >Optical Characterization of Indium Arsenide Antimonide Semiconductors Grown byMolecular Beam Epitaxy
【24h】

Optical Characterization of Indium Arsenide Antimonide Semiconductors Grown byMolecular Beam Epitaxy

机译:分子束外延生长砷化铟锑半导体的光学表征

获取原文

摘要

The material parameters and crystalline quality of undoped, MBE-grown InAs(1-x)Sb(x) neary lattice-matched to (100) GaSb (-0.617% less than or equal delta a/a less than or equal +0.708%) similar to material used for mid-infrared semiconductor lasers were determined by optical characterization. Absorption measurements at temperatures between 6-295 K determined the energy gap and wavelength-dependent absorption coefficient for each sample. The compositional dependence of the energy gap was anomalous when compared to previously reported data, suggesting phase separation existed in the material. The samples were also

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号