In Situ STM and UHV-EC: Complementary, not Competiting, Techniques

摘要

The development of in situ scanning tunneling microscopy (STM) has opened newavenues of research in electrochemical surface science. By itself, this nanometerscale structural tool cannot be regarded as a panacea for the many problems that confront researchers in the interfacial sciences. However, when employed in tandem with other surface-sensitive analytical methods, even exceedingly complex processes can be investigated. Two cases are presented here that showcase the power of in situ STM coupled with combined ultrahigh vacuum-electrochemistry (UHV-EC) techniques.