HEDM Source Characterization by Multi-Photon Ionization Time-of-Flight Mass Spectrometry.

摘要

We present results obtained using an apparatus designed to characterize the species produced by a variety of HEDM sources. In this apparatus, the HEDM species are ionized by a pulsed excimer laser beam and analyzed by time-of-flight mass spectrometry. Complications arising from photofragmentation vs. photoionization were encountered and documented as a function of ionization wavelength and intensity.