50 GHz Test Module for High-Speed Optically-Interconnected Systems

摘要

A system intended for designing and testing High-Speed Electro-Optic interconnection devices and systems was constructed by using a Hewlett Packard 8510C network analyzer system, which is purchased with the equipment grant, and uses a Wiltron 3680V series Universal Test Fixture. This system can test both coaxial devices and non-coaxial devices which have coplanar waveguide structures or micro strip structures, with frequencies up to 50 GHzs. This system has been used in traveling wave electrode design and its optimizing process for high- speed polymer based EO modulator also.