Binary Chirped Grating Diffractive Element for Sinusoidal to Linear Scanning Conversion: The Beam Propagation Design (Preprint); Journal article

摘要

We fabricated and tested our previously designed optical correction element with zoom capability to convert nonlinear sinusoidal scans into linear scans. The design methodology is based on derivating a graded index of refraction device as a reference design and converting the graded index of refraction into an amplitude or phase binarized diffractive element. Our graded index of refraction derivation is based on the propagation of an electromagnetic wave in an inhomogeneous media. Our experimental results showed the first order diffraction linearization of the sinusoidal scanning which is in agreement with our theory. The second order linearization was also discovered experimentally which was not predicted by the theory. The tests of the diffractive element device indicate that the linearization has small errors.