首页> 美国政府科技报告 >Total and Differential Sputter Yields of Boron Nitride Measured by Quartz Crystal Microbalance (Preprint)

【24h】

Total and Differential Sputter Yields of Boron Nitride Measured by Quartz Crystal Microbalance (Preprint)

机译：石英晶体微天平（预印）测量氮化硼的总和差分溅射产率

获取原文

页面导航

摘要
著录项
相似文献
相关主题

摘要

We present differential sputter yield measurements of boron nitride due to bombardment by xenon ions. A four-grid ion optics system is used to achieve a collimated ion beam at low energy.

著录项

作者
Rubin, B.; Topper, J. L.; Yalin, A. P.;
展开▼
作者单位

展开▼
年度 2009
页码 p.1-19
总页数 19
原文格式 PDF
正文语种 eng
中图分类工业技术;
关键词
Sputtering ; Electric propulsion ; Boron nitrides ; Experimental design ; Laboratory equipment ; Xenon ; Symposia ; Measurement ; Mathematical models;

机译：溅射;电推进;氮化硼;实验设计;实验室设备;氙;专题讨论会;测量;数学模型;

相似文献

外文文献
中文文献
专利

1. Total and differential sputter yields of boron nitride measured by quartz crystal microbalance [J] . B Rubin, J L Topper, A P Yalin Journal of Physics, D. Applied Physics: A Europhysics Journal . 2009,第20期

机译：石英晶体微天平测得的氮化硼总和差分溅射产量
2. Lubricity of gold nanocrystals on graphene measured using quartz crystal microbalance [J] . M. S. Lodge, C. Tang, B. T. Blue, Scientific reports. . 2016,第1期

机译：使用石英晶体微稳定测量石墨烯上的金纳米晶体的润滑性
3. Evaporative Crystallization of Dibenzoylmethanato Boron Difluoride Probed by Time-resolved Quartz Crystal Microbalance Responses with Fluorescence Changes [J] . Ito Fuyuki, Saigusa Mai, Kanayama Naoki Chemistry Letters . 2019,第10期

机译：通过时间分辨的石英晶晶微相响应蒸发二苯甲酰基甲烷硼硼二氟化硼的蒸发结晶，荧光变化
4. Differential Sputter Yields Of Boron Nitride, Quartz, and Kapton Due to Low Energy Xe+ Bombardment [C] . A. Yalin, B. Rubin, S. Domingue, AIAA/ASME/SAE/ASEE Joint Propulsion Conference Exhibit . 2007

机译：低能Xe +轰击导致氮化硼，石英和Kapton的差分溅射产率
5. Total and differential sputter yields of boron nitride [D] . Topper, James Leo, IV 2011

机译：氮化硼的总和差分溅射产量
6. Lubricity of gold nanocrystals on graphene measured using quartz crystal microbalance [O] . M. S. Lodge, C. Tang, B. T. Blue, -1

机译：使用石英晶体微量天平测量石墨烯上的金纳米晶体的润滑性
7. Sputtering yield measurements at glancing incidence using a quartz crystal microbalance [O] . Kolasinski Robert D., Polk James E., Goebel Dan, 2007

机译：使用石英晶体微量天平在一目了然的情况下进行溅射产率测量
8. Total and Differential Sputter Yields of Boron Nitride Measured by Quartz Crystal Microbalance (Preprint) [R] . Rubin, B., Topper, J., Yalin, A. P. 2009

机译：石英晶体微天平（预印）测量氮化硼的总和差分溅射产率

Total and Differential Sputter Yields of Boron Nitride Measured by Quartz Crystal Microbalance (Preprint)

摘要

著录项

相似文献

相关主题

期刊订阅