Test Procedures for Evaluating Terminal Protection Devices Used in EMP Applications.

摘要

Certain commercially available components were tested to establish test procedures for characterizing terminal protection devices used in electromagnetic-pulse (EMP) applications. The devices tested include spark gaps, filters, avalanche diodes, and various other nonlinear components. Square pulses of 50- and 500-nsec duration and up to 11 kV in amplitude, with rise times of 2 to 4 nsec, were applied to the devices. Response time and energy leakage were recorded for each test. Insertion loss and approximate failure level were measured for each device. Results are presented in tabular form. The devices that appear suitable for terminal protection include spark gaps, some filters, and some semiconductor devices with breakdown voltage less than about 50.