Design Guidelines and Optimization Procedures for Test Subsystem Design

摘要

This study provides guidelines and procedures to optimize the design of built-in-test equipment. The procedures are applicable to the design of both avionic and ground electronic systems. Optimization of the test subsystem is achieved by properly specifying three key design parameters (test effectiveness, mean corrective maintenance time, and test subsystem production costs) during the Conceptual Phase. These parameters then form the 'design to' criteria for optimization during the System, Subsystem, and Detail Design Phases. The report provides straightforward mathematical tools, algorithms, and trade-off procedures to assist the designer during each design phase. (Author)