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Validation and Application of a Bistatic Two-Scale of Surface Roughness Scattering Model.

机译:双站双尺度表面粗糙度散射模型的验证与应用。

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摘要

Bistatic configurations are being considered in several modern surveillance radar concepts. This introduces new clutter and target scattering cross section representations as a result of the more complex geometry. In this report three bistatic clutter topics are addressed. First, a bistatic two-scale of roughness terrain scattering model is validated by comparison with data. Second, the contributions from each roughness level are evaluated as a function of the scattering angle regimes. Third, comparisons of monostatic and bistatic clutter cross section maps for a loam surface are made for a bistatic radar configuration. Results showed generally good agreement between model and data except at low grazing angles where problems arise for experimental cross section measurements and single scattering assumptions in the model. Examination of the individual component contribution shows distinct behavior patterns and regions of dominance. Finally, the clutter mapping shows that for the configuration studied the bistatic cross sections were always much larger than the corresponding monostatic values. (kr)

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