首页> 外军国防科技报告 >Transistors Having On-Chip Integrared Photon Source or Photonic-Ohmic Drain to Facilitate De-Trapping Electrons Trapped in Deep Traps of Transistors
【2h】

Transistors Having On-Chip Integrared Photon Source or Photonic-Ohmic Drain to Facilitate De-Trapping Electrons Trapped in Deep Traps of Transistors

机译:晶体管具有片上Integrared光子源或光子欧姆漏到促进德捕获电子被困在晶体管的深陷阱

代理获取
代理获取并翻译 | 示例

摘要

Techniques are provided that pumping of deep traps in GaN electronic devices using photons from an on-chip photon source. In various embodiments, a method for optical pump­ing of deep traps in GaN HEMTs is provided using an on-chip integrated photon source that is configured to gen­erate photons during operation of the HEMT. In an aspect, the on-chip photon source is a SoH-LED. In various addi­tional embodiments, an integration scheme is provided that integrates the photon source into the drain electrode of a HEMT, thereby converting the conventional HEMT with an ohmic drain to a transistor with hybrid photonic-ohmic drain (POD), a POD transistor or PODFET for short.

著录项

  • 作者

    Chen, JingLi, Baikui; Tang, Xi;

  • 作者单位
  • 年(卷),期 2019(),
  • 年度 2019
  • 页码
  • 总页数 41
  • 原文格式 PDF
  • 正文语种
  • 中图分类
  • 网站名称 香港科技大学图书馆
  • 栏目名称 所有文件
  • 关键词

代理获取

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号