This work highlights recent research in the field of radiation effects in silicon-based integrated electronic-photonic circuits (ePICs). This technology involves adding additional steps to a Si CMOS or SiGe BiCMOS fabrication process to create monolithically integrated photonic components on die, right alongside conventional electronics. ePIC technology facilitates size, weight, power, and cost scaling in communication and sensing systems which have relevance for space applications. Initial studies indicate some photonic components exhibit resiliency in the inherently harsh space radiation environment. Two recent works are summarized. The first outlines an approach for predicting the response of an integrated silicon optical waveguide to a heavy ion strike. The second is on the total ionizing dose response of Ge-on-Si waveguide-integrated photodiodes.
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