This paper describes circuit-level built-in self-test(BIST) techniques for (a) monitoring the performance of RF devices, including LNAs, mixers, and oscillators, (b) assigning unique identification numbers to chips using on-chip monitor information, and (c) algorithms to authenticate/identify chips through the supply chain and estimate remaining lifetime in the field. These techniques increase the confidence for system performance not only at the time of system integration, but also through the entire operation. The information from the monitors will be used to predict the remaining lifetime of the device. A mechanism for multi-variate unique identifier that can authenticate chips at the time of system integration is described that is based on combining the statistical variation in all parameters. Combination of this unique ID with in-field aging data enables tracking and identification of chips in the supply chain even after they have been used in the field. The paper shows results of analyses of device-specific and process-specific measurements that ensure that the goals of monitoring performance, unique identification, and device authentication are met when using the proposed methodologies and tools.
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