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Determination of Metal Ion Contents in Nanomaterials Solution Using Inductively Coupled Plasma-Mass Spectrometry (ICP-MS): Nano Risk SOP-P

机译:电感耦合等离子体质谱(ICp-ms)测定纳米材料中金属离子含量:纳米风险sOp-p

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摘要

The presence of metal ions from either metal catalyst or contamination in nanomaterial solutions could directly impact the product quality, such as sensor performance. Inductively coupled plasma-mass spectrometry (ICP-MS), one of the most sensitive analytical techniques used for trace multi-element detection, has become a common tool in many laboratories for determining the metal impurities in various types of samples. This scientific operating procedure (SOP) describes the operation and use of ICP-MS to determine trace metal concentrations in nanomaterials solutions. Procedures and recommendations of sample preparation, instrument preparation, sample analysis and results analysis are included. The procedure has been tested on a variety of carbon-based nanomaterial solutions.

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