This study describes inverse modeling of absorption-spectrum transferability with respect to substrates for tailoring the NIR SWIR reflectance of dyed fabrics, which is important for optimizing reflectance of camouflaged fabrics. Inverse modeling is applied to reflectance spectra of a prototypical IR absorbing dye, which has been deposited upon different substrates, with different deposit-layer thicknesses. IR absorption features of any given IR absorbing dye will be a function of deposit-layer microstructure and dielectric response of substrate material. Therefore, one should examine the feasibility of parametrically modeling absorption-spectrum dependence on deposit microstructure and dielectric response properties of substrates, which is relevant to simulating reflectance spectra of IR-absorbing-dye blends in fabrics, in particular, the feasibility of modeling transferability of dye-in-fabric absorption spectra, for given fabrics, to different types of fabrics, whose undyed reflectance spectra are known.
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