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Spontaneous emission in highly excited semiconductors: Saturation of the radiative recombination rate

机译:高激发半导体中的自发发射:辐射复合速率的饱和

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The spontaneous emission rate of semiconductors displays a saturation at high carrier injection densities due to the filling of the conduction and valence bands. We have carried out time-resolved experiments, whereby a semiconductor quantum well at room temperature is excited optically by a short laser pulse and the time decay of its luminescence is measured for different injected carrier densities. The luminescence decay rate, plotted as a function of injected carrier density, deviates strongly from the well-known quadratic recombination law, valid at low carrier densities, displaying a saturation. We have developed a simple analytic theory that accounts for this saturation and can describe adequately the recombination kinetics of highly excited semiconductor quantum wells. (C) 2002 American Institute of Physics. References: 10
机译:由于导带和价带的填充,半导体的自发发射速率在高载流子注入密度下呈现饱和。我们进行了时间分辨实验,其中室温下的半导体量子阱被短激光脉冲以光学激发,并测量了不同注入载流子密度下其发光的时间衰减。发光衰减率绘制为注入载流子密度的函数,与众所周知的二次复合定律有很大差异,该定律在低载流子密度下有效,显示饱和。我们开发了一种简单的解析理论来解释这种饱和度,并可以充分描述高激发半导体量子阱的复合动力学。(C) 2002年美国物理研究所。[参考资料: 10]

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