机译:耗尽层中随机杂质产生的金属氧化物半导体场效应晶体管的潜在波动
Device Modelling Group, Department of Electronics and Electrical Engineering, University of Glasgow, Glasgow G12 8QQ, United Kingdom;
rovidence.org;
机译:Simple nondestructive extraction of the vertical channel-impurity profile of small-size metal-oxide-semiconductor field-effect transistors
机译:Electrical effects of a single stacking fault on fully depleted thin-film silicon-on-insulator P-channel metal-oxide-semiconductor field-effect transistors
机译:Carrier scattering induced by thickness fluctuation of silicon-on-insulator film in ultrathin-body metal-oxide-semiconductor field-effect transistors