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机译:
Physics Institute, Justus Liebig University Giessen, Heinrich-Buff-Ring 16, 35392 Giessen, Germany;
机译:Secondary ion mass spectroscopy determination of oxygen diffusion coefficient in heavily Sb doped Si
机译:Secondary ion mass spectroscopy investigations of magnesium and carbon doped gallium nitride films grown by molecular beam epitaxy
机译:In situ determination of surface composition, polarity, crystallographic relationship, and periodicity of GaN films by mass spectroscopy of recoiled Ions and direct recoiled spectroscopy
机译:Oxygen-stoichiometry-dependent microstructural and magnetic properties of Copt thin films capped with ion-beam-assisted deposited TiOx layers