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首页> 外文期刊>Journal of Applied Physics >Time-resolved photoluminescence lifetime measurements of the Γ_(5) and Γ_(6) free excitons in ZnO
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Time-resolved photoluminescence lifetime measurements of the Γ_(5) and Γ_(6) free excitons in ZnO

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摘要

Time-resolved photoluminescence spectroscopy at 2 K was used to measure the radiative recombination lifetime of the allowed (Γ_(5)) and forbidden (Γ_(6)) free excitons in ZnO. The measurements were made on a sample containing internal strain, which altered the sample symmetry, and resulted in relaxed selection rules, allowing theΓ_(6) exciton to be observed. A radiative recombination lifetime of 259 ps was measured for the Γ_(5) exciton and 245 ps for the Γ_(6) exciton. The decay of the free excitons was of single-exponential form, and the decay times were obtained using a least-squares fit of the data.

著录项

  • 来源
    《Journal of Applied Physics 》 |2000年第4期| 2152-2153| 共2页
  • 作者单位

    Semiconductor Research Center, Wright State University, Dayton, Ohio 45435;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学 ;
  • 关键词

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