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Temperature characteristic of carrier scattering and dark resistivity of semi-insulating GaAs

机译:半绝缘砷化镓的载流子散射温度特性和暗电阻率

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摘要

The electron mobility and the dark resistivity of undoped semi-insulating GaAs have been calculated theoretically over the temperature range from 5 to 500 K by taking into consideration all indispensable scattering processes, screening effects, and impurities compensation action. The two temperature characteristic curves of electron mobility and dark resistivity both exhibit unimodality. The peak value of the mobility as high as 11.4 x 10(5) cm(2) V-1 s(-1) can be achieved at 27 K, which is more than two orders of magnitude greater than that at 300 K. We analyzed the carrier relaxation rate due to scattering by ionized impurities, acoustic deformation potential, piezoelectric, and polar optical phonons. It is found that the unusually thermal characteristic is dominated by ionized impurity scattering, piezoelectric scattering, and polar optical phonon scattering in different temperature ranges, respectively. According to the scattering theory models, the dominant position relationships between the two different carrier scatterings induced by acoustical phonons in two-dimensional GaAs layer and bulk semi-insulating GaAs are discussed, respectively. The peak value of dark resistivity is about 1.29 x 10(12) omega cm at 154 K, which is more than five orders of magnitude greater than that at 300 K. The theoretical results are in good agreement with previously published results. Moreover, the dependence of the peak value of dark resistivity on the deep and shallow donor concentrations are obtained, respectively, and the mechanisms of the dependence are discussed. Understanding of thermal properties of dark resistivity and mobility can be used to optimize GaAs-based electronic and photonic devices' performance in different temperature regimes.
机译:在5-500 K的温度范围内,理论上计算了未掺杂半绝缘GaAs的电子迁移率和暗电阻率,并考虑了所有必不可少的散射过程、筛选效应和杂质补偿作用。电子迁移率和暗电阻率的两条温度特性曲线均表现出单峰性。在27 K时可以达到高达11.4 x 10(5) cm(2) V-1 s(-1)的迁移率峰值,比300 K时高出两个数量级以上。我们分析了电离杂质散射引起的载流子弛豫速率、声学变形势、压电和极性光学声子。研究发现,不同温度范围内的异常热特性主要表现为电离杂质散射、压电散射和极性光声子散射。根据散射理论模型,分别讨论了二维GaAs层和体半绝缘GaAs中声学声子诱导的两种不同载流子散射之间的主导位置关系。在154 K时,暗电阻率的峰值约为1.29 x 10(12)ωcm,比300 K时的峰值大5个数量级以上。理论结果与先前发表的结果吻合较好。此外,分别得到了暗电阻率峰值对深层和浅层供体浓度的依赖性,并讨论了依赖性机制。了解暗电阻率和迁移率的热特性可用于优化基于砷化镓的电子和光子器件在不同温度条件下的性能。

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