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Research development of measuring methods on the tribology characters for movable MEMS devices: a review

机译:可移动MEMS器件摩擦学特性测量方法的研究进展

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摘要

Micro electro-mechanical systems (MEMS) offers great promise for system integration of sensors, actuators and signal processing. However, to the movable MEMS devices, there have always been major obstacles to their realization and reliability in the past - tribology problems. Because of the size effect, the conventional frictional law is no longer feasible to MEMS devices. It is vital to do research on micro-tribology and rebuild a micro-tribology theory in which size effect must be concerned. At the same time, in order to obtain reliable experimental data to support the theory, a feasible measuring method is also necessary. This paper describes two kinds of measuring methods to realize this purpose - on-chip measuring method and off-chip measuring method. Advantages, disadvantages, research status and the application prospect of each kind of methods are all introduced. Finally, development prospect of measuring methods is mentioned.
机译:微机电系统(MEMS)为传感器,执行器和信号处理的系统集成提供了广阔的前景。然而,对于可移动MEMS器件,过去一直存在阻碍其实现和可靠性的主要障碍-摩擦学问题。由于尺寸效应,常规的摩擦定律对于MEMS器件不再可行。进行微摩擦学研究并重建必须关注尺寸效应的微摩擦学理论至关重要。同时,为了获得可靠的实验数据以支持该理论,还需要一种可行的测量方法。本文介绍了两种实现此目的的测量方法-片上测量方法和片外测量方法。介绍了各种方法的优缺点,研究现状和应用前景。最后,介绍了测量方法的发展前景。

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