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机译:
Univ Poitiers, CNRS, UMR 6630, Met Phys Lab, F-86962 Futuroscope, France;
ENSMA, UMR 6617, Mecan & Phys Mat Lab, CNRS, F-86961 Futuroscope, France;
ALUMINUM-NITRIDE FILMS; X-RAY; TRIBOLOGICAL PROPERTIES; THERMAL-STABILITY; CRYSTAL STRUCTURE; TERNARY CERAMICS; COATINGS; TIN; BEHAVIOR; CARBIDE;
机译:Metastable and equilibrium phase formation in sputter-deposited Ti/Al multilayer thin films
机译:C-Rate Capability of Ion-Beam Sputter Deposited Silicon, Carbon and Silicon/Carbon Multilayer Thin Films for Li-Ion Batteries
机译:Co/C and W/Si multilayers deposited by ion-beam sputtering for the soft X-ray range
机译:Ti2AlN和Ti2AlN / TiN复合材料的循环氧化行为
机译:导电Al2O3-TiN复合材料的Ti反应烧结:Ti的粒径和形貌对电学和力学性能的影响
机译:Ti-Al-BN粉末混合物燃烧反应过程产生的TiAl-(Tib2 + Ti2Aln)复合材料的微观结构和力学性能。
机译:Ti / al2O3,Ti3al / al2O3和Tial / al2O3复合材料的界面稳定性研究