Media thermal robustness (MTR) text to quantify lifetime for media thermal decay

摘要

A Media Thermal Robustness (MTR) test has been developed to quantify lifetime for media thermal decay. In this test, erasing currents produced by the write coil of a head were used to stress a written track. Amplitude was monitored as a function of log/time) to and beyond the failure point of 85 of initial amplitude. The lifetime with current = 0 can be obtained by extrapolating log(f{sub}0·lifetime){sup}(2/3) versus current to current = 0, where f{sub}0 ～10{sup}9 Hz, is the attempt frequency. This MTR test procedure allows the media thermal decay lifetime to be determined in ～2 hours. Consistency of short and long media lifetime predictions by MTR test was found to be quite good. Repeatability of lifetime prediction was demonstrated to be within a reasonably narrow range.