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Effect of aging on wettability of silicon surfaces modified by Ar implantation

机译:老化对Ar注入改性硅表面润湿性的影响

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摘要

The contact angles of most surfaces modified by ion implantation change with the passage of time. The aim of this experiment is to better understand the mechanism leading to the aging of argon implanted silicon oxide surfaces. Coupons of silicon with its native oxide layer have been irradiated by means of 3 keV Ar ions with a fluence of 1.8x10(16) Ar/cm(2). Some of the implantations have been performed under oxygen partial pressure (similar to5x10(-5) Torr). The samples have been characterized at different periods of time after the implantation, by means of contact angle hysteresis measurements and angle resolved x-ray photoelectron spectroscopy (ARXPS). Irradiation with Ar ions has produced a more hydrophilic surface immediately after implantation. With the passage of time, the contact angles have increased both in ambient air and in argon atmosphere. Characterization by means of XPS has shown that there is with time a small increase of the O concentration as well as a small decrease of the quantity of Ar in the silicon oxide surfaces. The shape of the C 1s and Si 2p spectra and their details are also slightly modified with the passage of time. A model using the ARXPS measurements suggests that for the samples implanted without oxygen, the aging would be principally due to the spreading of a natural carbonaceous surface layer dispersed into islands after the Ar implantation. The layer being more hydrophobic than the silicon oxide, its spreading would increase the apparent contact angles. On the other hand, the increase of the carbon concentration in the carbonaceous layer would produce a more hydrophobic surface and would be responsible for the aging of the samples implanted in O-2 partial pressure. Results obtained by means of a simple model and the Cassie's equation suggest that for the samples implanted without O-2 gas, the contact angles of the substrate and the carbonaceous layer are 5degrees and 110degrees, respectively. The apparent contact angle obtained with the Cassie's equation is in good agreement with the experimental measurements. (C) 2002 American Institute of Physics. References: 10
机译:通过离子注入改变的大多数表面的接触角随着时间的推移而变化。本实验的目的是更好地了解导致氩气注入氧化硅表面老化的机制。硅及其天然氧化层的试样已通过 3 keV Ar 离子以 1.8x10(16) Ar/cm(2) 的通量进行辐照。一些植入是在氧分压下进行的(类似于5x10(-5)Torr)。通过接触角滞后测量和角度分辨 X 射线光电子能谱 (ARXPS) 对样品在植入后的不同时间段进行了表征。用氩离子照射在植入后立即产生更亲水的表面。随着时间的流逝,环境空气和氩气中的接触角都有所增加。通过XPS进行表征表明,随着时间的推移,氧化硅表面的O浓度略有增加,而Ar的含量则略有减少。随着时间的流逝,C 1s和Si 2p光谱的形状及其细节也略有变化。使用ARXPS测量的模型表明,对于没有氧气的植入样品,老化主要是由于Ar植入后分散到岛屿中的天然碳质表层的扩散。该层比氧化硅更疏水,其扩散会增加表观接触角。另一方面,碳质层中碳浓度的增加将产生更疏水的表面,并导致在O-2分压下植入的样品老化。通过简单模型和Cassie方程获得的结果表明,对于没有O-2气体的注入样品,基板和碳质层的接触角分别为5度和110度。用卡西方程得到的表观接触角与实验测量结果吻合良好。(C) 2002年美国物理研究所。[参考资料: 10]

著录项

  • 来源
    《Journal of Applied Physics》 |2002年第10期|5872-5877|共6页
  • 作者

    Chasse M.; Ross GG.;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学;
  • 关键词

    Ion;

    机译:离子;

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