Frequency dependence of magnetic anisotropy in Ni/Mo multilayers (abstract)

摘要

Based upon earlier findings,1an investigation of frequency‐dependent effects in interface anisotropy has been undertaken, preliminary results of which are presented. Six equal‐layer‐thickness Ni/Mo multilayer samples ranging in Ni layer thicknessdfrom 20 to 1000 A˚ were measured in the parallel geometry by 4, 9, 18, and 36 GHz ferromagnetic resonance at room temperature. The total anisotropy decreases with decreasing frequency for smalldsamples and increases with decreasing frequency for largedsamples, thereby establishing theexistenceof frequency dependence. Measurements at low temperature, where the interface anisotropy (IA) is much more pronounced, are underway to investigate the IA frequency dependence.