Relative Abundances and Recoil Energies of Fragment Ions Formed from the Xhyphen;Ray Photoionization of N2, O2, CO, NO, CO2, and CF4

摘要

A specially designed mass spectrometer has been used to study the fragment ions following xhyphen;ray photoionization of several simple gaseous molecules, containing only firsthyphen;row elements. Two photon sources were used: CuLagr;(930 eV) and CKagr;(280 eV). The higherhyphen;energy xhyphen;ray source produced initial vacancies primarily in theKshells of the different elements, while the lowerhyphen;energy radiation produced ionization entirely in the valence shells. Data were obtained as a function of collection voltage, and relative abundances of the fragment ions were evaluated under conditions of equal collection efficiency. From the shape of the collection efficiency curve the average recoil energies were estimated. The results are briefly discussed in terms of the effect of the KLL Auger processes and multiple ionization.