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The effect of surface states and fixed charge on the field effect conductance of amorphous silicon

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摘要

We have developed a computer program to calculate the field effect conductance for an amorphous semiconductor including the effects of surface states and fixed charge atbothsurfaces of the thin semiconductor film. For undoped films with a bulk density of states of less than 1017cmminus;3eVminus;1, the spacehyphen;charge region extends to a depth of 0.5 mgr;m. A complete description of the potential distribution in the semiconductor must include the contribution of surface charge from the surfaceoppositethe gate electrode. This is of practical importance in thin film transistors, for example, where different transistor structures and processing of devices can affect the charge density of this surface.

著录项

  • 来源
    《journal of applied physics 》 |1983年第6期| 3244-3248| 共页
  • 作者

    M. J. Powell; J. Pritchard;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
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