Guest Editorial

摘要

AS GUEST Editors, we are honored and excited to introduce this TRANSACTIONS' Mini-Special Issue on "Measurements for Large-Signal Characterization and Modeling of Nonlinear Analog Devices, Circuits, and Systems." Large-signal measurements reveal the detailed, often extremely rich, nonlinear dynamical responses exhibited by analog microwave devices, circuits, and systems under conditions of actual use in a way that static (dc) and linear (S-parameter) measurements simply cannot. In other words, large-signal measurements provide the quantitative basis for scientific understanding, as well as engineering exploitation of real-world nonlinear devices, circuits, and systems. Measurements of complex dynamic nonlinear phenomena can be made in the time, frequency, or mixed (e.g., envelope) domains. In many cases, new types of instrumentation (e.g., large-signal network analyzers) are necessary to capture this behavior. In some cases, new identification algorithms and techniques can be applied with existing hardware to obtain the needed data.