机译:Fly-A 新型双端口 S 参数测量方法的 Fly-A 晶圆上泄漏系统的校准
Hebei Semicond Res Inst, Dept Metrol & Maintenance, Shijiazhuang 050051, Hebei, Peoples R China;
Hebei Semicond Res Inst, Dept Technol, Shijiazhuang 050051, Hebei, Peoples R China;
Univ Glasgow, Div Elect & Nanoscale Engn, Glasgow G12 8LT, Lanark, ScotlandNatl Phys Lab, Teddington TW11 0LW, Middx, England;
Calibration; error model; millimeter-wave measurement; on-wafer measurement; scattering parameter (S-parameter);