Analysis of Dielectric Relaxation in Sodium Silicate (Na2SiO3) using Complex Impedance Spectroscopy

摘要

Abstract The present study highlights the frequency and temperature-dependent dielectric relaxation of sodium silicate (Na2SiO3) (SS) using complex impedance spectroscopy (CIS) to understand multiple polarization effects. The orthorhombic crystal phase of SS was synthesized using a high-temperature solid-state reaction process. Dielectric relaxation in SS has been studied in different frequency regions. CIS indicates the strong dispersion effect in the low-frequency region. The amount and nature of dielectric relaxation have been explained using different functions such as complex impedance Zωdocumentclass12pt{minimal} usepackage{amsmath} usepackage{wasysym} usepackage{amsfonts} usepackage{amssymb} usepackage{amsbsy} usepackage{mathrsfs} usepackage{upgreek} setlength{oddsidemargin}{-69pt} begin{document}$$left( {Zleft( omega right)} right)$$end{document}, loss tangent tanδdocumentclass12pt{minimal} usepackage{amsmath} usepackage{wasysym} usepackage{amsfonts} usepackage{amssymb} usepackage{amsbsy} usepackage{mathrsfs} usepackage{upgreek} setlength{oddsidemargin}{-69pt} begin{document}$$left( {tan delta } right)$$end{document}, and elastic modulus Mωdocumentclass12pt{minimal} usepackage{amsmath} usepackage{wasysym} usepackage{amsfonts} usepackage{amssymb} usepackage{amsbsy} usepackage{mathrsfs} usepackage{upgreek} setlength{oddsidemargin}{-69pt} begin{document}$$left( {Mleft( omega right)} right)$$end{document}. The temperature-dependent relaxation graph obeys the Arrhenius law and the slope which gives the measurement of activation energy.