...
首页> 外文期刊>International Journal of Plasticity >Multiscale strain measurements of plastically deforming polycrystalline titanium: Role of deformation heterogeneities
【24h】

Multiscale strain measurements of plastically deforming polycrystalline titanium: Role of deformation heterogeneities

机译:塑性变形多晶钛的多尺度应变测量:变形异质性的作用

获取原文
获取原文并翻译 | 示例

摘要

The purpose of this work was to characterize the spatial distribution of residual deformation at the mesoscale (a few grains) and at the macroscale (hundreds of grains) in titanium subjected to cyclic tensile loading. Using ex situ digital image correlation, we compared the axial residual strain fields obtained at optical magnifications ranging from 3.2to 50. To compare the results obtained at different optical magnifications, numerous images at higher magnification had to be assembled to encompass the same field-of-view observed at lower magnifications. The strain fields at the highest optical magnification revealed deformation patterns that were not detectable at lower magnifications. These deformation patterns appeared as inclined slip bands near grain boundaries and grain boundary triple points, with the bands sometimes crossing into neighboring grain interiors. Measurements made at optical magnifications greater than 10 captured an underlying deformation pattern, however, considerably more detail within grains was obtained at 50 magnification.The strain fields obtained at 10 and 50 magnifications were subsequently used to estimate the length scale of a representative volume element (RVE) based on the standard deviation of the average residual strain. The estimated RVE length scale was nearly three times the average grain diameter if extracted from the 50 results. The estimate of the RVE length scale was smaller at lower magnification which was due to a homogenizing effect caused by the low measurement resolution. Thus, care must be taken when experimentally obtaining RVE length scale estimates.
机译:这项工作的目的是表征承受周期性拉伸载荷的钛中尺度(几个晶粒)和宏观尺度(数百个晶粒)的残余变形的空间分布。使用非原位数字图像相关性,我们比较了在光学倍率从3.2到50范围内获得的轴向残余应变场。为了比较在不同光学倍率下获得的结果,必须组装多个高倍率的图像以包含相同的视场。 -在较低放大倍率下观察到的视图。最高光学放大倍数下的应变场显示出在较低放大倍数下无法检测到的变形模式。这些变形模式表现为在晶界和晶界三重点附近的倾斜滑带,有时带状带进入相邻的晶粒内部。在大于10的光学放大倍数下进行的测量捕获了潜在的变形模式,但是,在50放大倍数下获得了晶粒内的更多细节.10和50放大倍数下获得的应变场随后被用于估算代表性体积元素的长度尺度( RVE)基于平均残余应变的标准偏差。如果从50个结果中提取,则估计的RVE长度尺度几乎是平均粒径的三倍。在较低的放大倍数下,RVE长度标尺的估计值较小,这是由于低测量分辨率导致的均化效果所致。因此,在实验上获得RVE长度比例估计值时必须小心。

著录项

相似文献

  • 外文文献
  • 中文文献
  • 专利
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号