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Trap emission rates in GaAs in the presence of surface acoustic waves

机译:存在表面声波的砷化镓中的陷阱发射率

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摘要

Experimental and theoretical analyses of the effects of surface acoustic waves (SAW) on trap emission rates in GaAs are presented. Measurements of electron trap emission rates using deep level transient spectroscopy measurements performed in the presence of SAW are discussed. For the three trapping levels investigated, the observed increases in the trap emission rates can be described by trap activation energies which decrease in direct proportion to the SAW power. A theoretical analysis of the effects of the acoustic strain, electric field, and heating associated with the SAW is also presented. This analysis is used to predict the magnitude and functional dependence of the emission rate enhancement. The theoretical predictions follow the same functional dependence as the experimental data but the predicted magnitudes of the shifts in trap energies are about a factor of 2 lower than the measured values.
机译:本文对表面声波(SAW)对砷化镓中陷阱发射速率的影响进行了实验和理论分析。讨论了在SAW存在下使用深能级瞬态光谱测量来测量电子阱发射速率的方法。对于所研究的三个捕集水平,观察到的捕集发射速率的增加可以用捕集活化能来描述,捕集活化能与SAW功率成正比。此外,还对与SAW相关的声应变、电场和加热的影响进行了理论分析。该分析用于预测排放速率增强的幅度和功能依赖性。理论预测遵循与实验数据相同的功能依赖性,但陷阱能量变化的预测幅度比测量值低约2倍。

著录项

  • 来源
    《journal of applied physics》 |1990年第10期|6315-6322|共页
  • 作者

    D. Janes; M. J. Hoskins;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
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