首页> 外文期刊>Applied physics letters >Microdefects in AI↓(2)O↓(3) films and interfaces revealed by positron lifetime spectroscopy
【24h】

Microdefects in AI↓(2)O↓(3) films and interfaces revealed by positron lifetime spectroscopy

机译:Microdefects in AI↓(2)O↓(3) films and interfaces revealed by positron lifetime spectroscopy

获取原文
获取原文并翻译 | 示例
       

摘要

We have studied microdefects and interfaces of AI203 films on iron and nickel aluminide substrates using variable-energy positron lifetime spectroscopy. Di-vacancies, vacancy clusters, and microvoids were observed in the oxide scales. Their sizes and distributions were determined by the nature of the process used to synthesize the alumina film. and influenced by the composition of the alloy substrates. For oxide-iron aluminide interfaces, positron lifetimes are longer than those for the alumina layer itself, suggesting a greater defect concentration at such sites.#1997 American Institute of Physics. S0003-6951(97)02547-3

著录项

  • 来源
    《Applied physics letters》 |1997年第24期|3165-3167|共3页
  • 作者单位

    Oak Ridge National Laboratory,/ Oak Ridge, Tennessee 37831-6142;

  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类 应用物理学;
  • 关键词

  • 入库时间 2024-01-29 17:18:35
获取原文

客服邮箱:kefu@zhangqiaokeyan.com

京公网安备:11010802029741号 ICP备案号:京ICP备15016152号-6 六维联合信息科技 (北京) 有限公司©版权所有
  • 客服微信

  • 服务号