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Step coverage simulation and measurement in a dc planar magnetron sputtering system

机译:Step coverage simulation and measurement in a dc planar magnetron sputtering system

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摘要

The step coverage of a dc planar magnetron sputtering system with a revolving substrate is analyzed by both computer simulation and measurement of the step coverage. The model assumes line of sight deposition, no reemission, and the cosine growth law. Good quantitative agreement has been obtained between the model and the experiments. The modeled system does not show the deep cracks typical of the point source planetary system. This is explained by comparing the vapor distribution functions of the planetary and the sputtering systems.

著录项

  • 来源
    《journal of applied physics 》 |1983年第6期| 3489-3496| 共页
  • 作者

    I. A. Blech; H. A. Vander Plas;

  • 作者单位
  • 收录信息 美国《科学引文索引》(SCI);美国《工程索引》(EI);美国《生物学医学文摘》(MEDLINE);
  • 原文格式 PDF
  • 正文语种 英语
  • 中图分类
  • 关键词

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