This paper discusses a theoretical as well as experimental study of the performance of electro‐optic sampling using a noncontact electro‐optic probe, i.e., external electro‐optic sampling. Sensitivity, temporal resolution, and the capacitive loading effect of this system are calculated by analysis of a static electric field coupled to an electro‐optic crystal placed in close proximity to transmission lines such as microstrip lines and coplanar strips. Full‐wave analysis is also applied to investigate effect of the electro‐optic crystal on the transient property of high‐speed electrical signals. Based on these analytical considerations, we have developed an external electro‐optic sampling system using precise probe‐positioning technology, which improves the measurement reproducibility. A temporal resolution of 0.5 ps and a spatial resolution of 1 mgr;m are confirmed with this system.
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