Dependence of charging on crystallographic orientations of an as‐grown agr;‐quartz

摘要

The scanning electron microscope copper‐detector technique introduced most recently by H. Gong and C. K. Ong J. Appl. Phys.75, 449 (1994) is employed for the investigation of charging on facesm{101¯0},R{101¯1}, and khgr; {516¯1} of single‐crystalline agr;‐quartz. It is found that the charging ability decreases in the order ofm,R, and khgr;, revealing the dependence of charging on crystallographic orientations, and these results are confirmed by the well‐established mirror‐image method. In addition, the experimental results also suggest that not only electron‐irradiation‐induced defects but also intrinsic defects are responsible for charge trapping.