The effect of the impact ionization dead space on avalanche multiplication and noise has been assessed for uniformp‐i‐navalanche photodiodes. This has required the development of a new numerical technique. The well‐established McIntyre theory of avalanche noise IEEE Trans. Electron DevicesED‐13, 164 (1966), which neglects the ionization dead‐space effect, has been shown to overestimate the excess noise factor. The implications of the dead‐space effect, for ionization coefficient determination and the interpretation of measured excess noise factors, are discussed.
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机译:已经评估了冲击电离死区对雪崩倍增和噪声的影响,用于均匀p&连字符;i&连字符;navalanche 光电二极管。这需要开发一种新的数值技术。公认的麦金太尔雪崩噪声理论[IEEE Trans. Electron DevicesED‐13, 164 (1966)]忽略了电离死区空间效应,已被证明高估了多余的噪声因子。讨论了死区效应对电离系数测定和测量过量噪声因子解释的影响。
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