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Cleavage energies in semiconductors

机译:半导体中的解理能

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We present a method for the calculation of the surface and cleavage energies,Eggr;, for semiconductors, based on a tight‐binding Green’s function approach and a difference‐equation solution for the layered structure. Energies are calculated for a representative group of semiconductors, and cleavage energies are found to agree well with the available experimental data. We findESiggr;(111)=1360 ergs/cm2, andEggr;(110)=1000, 180, and 120 ergs/cm2for GaAs, CdTe, and HgTe, respectively.
机译:我们提出了一种基于紧连字符绑定格林函数方法和层状结构差分方程解的半导体表面和解理能E&ggr;的方法。计算了一组具有代表性的半导体的能量,发现解理能量与可用的实验数据非常吻合。我们发现砷化镓、碲化镉和汞分别为ESi&ggr;(111)=1360 ergs/cm2,E&ggr;(110)=1000、180和120 ergs/cm2。

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