Leakage current and relaxation characteristics of highly (111)-oriented lead calcium titanate thin films

摘要

Highly (111)-oriented (Pb_(0.76)Ca_(0.24))TiO_(3) (PCT) thin films were grown on Pt/Ti/SiO_(2)/Si substrates by a sol-gel process. The Au/PCT/Pt metal-insulator-metal film capacitor showed well-saturated hysteresis loops at an applied field of 800 kV/cm with remanent polarization (P_(r)) and coercive electric field (E_(c)) values of 18.2 μC/cm~(2) and 210 kV/cm, respectively. The leakage current depended on the voltage polarity. At low electrical field and with Pt electrode biased negatively, the Pt/PCT interface exhibits a Schottky emission characteristics. The Au/PCT interface forms an ohmic contact. The conduction current when the Au electrode is biased negatively shows a space-charge-limited behavior. The dielectric relaxation current behavior of Au/PCT/Pt capacitor obeys the well-known Curie-von Schweidler law at low electric field. At higher fields, the currents have contributions to both dielectric relaxation current and leakage current.