The accelerated pre-oxidation method (APOM) was applied to heal progressive electrical short (PES) in organic light-emitting devices. The APOM applied to the devices showed approximately 100 times lower leakage current and 25 improvement in device efficiency compared to a normal device without the APOM applied. The mean projected lifetime of the APOM devices was more than 2400 h at initial luminance of 100 cd/m~(2) and 90℃, whereas the normal device turned off after 15 h of operation at the same temperature due to the PES phenomenon. The best stability at elevated temperature was achieved by using the APOM for the cathode layer.
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